September 26, 2017 UMD Home FabLab AIMLab
Back to Equipment List NTegra Spectra EC SPM Raman
Description Both upright and inverted configurations.
  • Atomic Force Microscopy ( > 30 modes )
  • Scanning Tunneling Microscopy
  • Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
  • Confocal Raman / Fluorescence / Rayleigh Microscopy
  • Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)
    Modes:
  • AFM (mechanical, electrical, magnetic properties, nanomanipulation, etc.)
  • STM
  • White Light Microscopy and Confocal Laser (Rayleigh) Imaging
  • Confocal Raman Imaging and Spectroscopy
  • Confocal Fluorescence Imaging and Spectroscopy
  • Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
  • Tip Enhanced Raman and Fluorescence Microscopy (TERS, TEFS, TERFS)
    Controlled environment:
  • Temperature
  • Humidity
  • Gases
  • Liquid
  • Electrochemical environment
  • External magnetic field
Location FabLab | FabLab
Manufacturer NTMDT nTegra Spectra
Link
Staff Contact GaryGary Rubloff
rubloff@isr.umd.edu
301-405-3011
Discussion Link Metrology Discussion Page
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Tue, Mar 31, 2015
2:00 pm - 5:00 pm
Amy Marquardt
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Fri, Nov 07, 2014
2:30 pm - 3:30 pm
Chuan-Fu Lin
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Mon, Nov 03, 2014
1:00 pm - 2:00 pm
Chuan-Fu Lin
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Thu, Oct 16, 2014
10:00 am - 11:00 am
Hyun Jung
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AFM measurement of 90um wide membrane
Mon, Oct 13, 2014
10:00 am - 11:00 am
Hyun Jung
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Deleted by: Ernie Cleveland

AFM measurement of 90um wide membrane
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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