• Atomic Force Microscopy ( > 30 modes )
• Scanning Tunneling Microscopy
• Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
• Confocal Raman / Fluorescence / Rayleigh Microscopy
• Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)

Modes:
• AFM (mechanical, electrical, magnetic properties, nanomanipulation, etc.)
• STM
• White Light Microscopy and Confocal Laser (Rayleigh) Imaging
• Confocal Raman Imaging and Spectroscopy
• Confocal Fluorescence Imaging and Spectroscopy
• Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
• Tip Enhanced Raman and Fluorescence Microscopy (TERS, TEFS, TERFS)

Controlled environment:
• Temperature
• Humidity
• Gases
• Liquid
• Electrochemical environment
• External magnetic field

If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring.