The AIM Lab at NanoCenter will be offering a short course in Scanning Electron Microscopy (SEM) during this winter break (January 2025) using our Hitachi SU-70 High Resolution Analytical SEM and Tescan XEIA FIB/SEM.
The short course provides an introduction to the SEM for those with little or no prior experience. This course covers basic principles and knowledge of the scanning electron microscope including energy-dispersive x-ray spectroscopy (EDS). In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.
Date: January 14, 15, 16 and 17, 2025
Lecture: 9:30 to 12:00 pm. (Room: TBA)
Laboratory: Two hours/group/day (4 days, January 14, 15, 16 and 17, 2025)
Rooms: Lecture: TBA
Lab: SEM facility, AIM Lab Kim Building room 1237C/E
Limit: Maximum enrollment is 9 (3 lab groups, 3 persons per group)
Fee: $395 per person, $360 per person from the same research groupand/or participate FIB/TEM short
course. $220 per person for taking lectures or lab (permission is required from the instructor) only.
Fees for non-UMD participants will be different. Please check with the AIM Lab office.
To enroll, please print and fill out the application form, and submit to the AIM Lab office by 5:00 pm, January 9, 2025 (Thursday) at room 1234 Kim Building. Students accepted into the class will be informed by e-mail by Sunday (01/12/2025).
To encourage all potential users to register for the short course, a discount will be offered to individuals if they are affiliated with a research group where other members are also enrolled in the course or if s/he is attending both TEM and SEM (see TEM short course announcement). * This fee applies to UMD users only. Different fees apply for non-UMD participants; please check with the AIM Lab office.
For more information regarding the SEM short course, please contact Wen-An Chiou at AIM Lab, or at (301)-405-0541 or send an e-mail to Dr. Chiou at wachiou@umd.edu.
