| Description |
The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS silicon drift detector for determining elemental composition of samples. Please, no powder samples in this SEM |
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| Location | FabLab |
Exploratory Lab
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| Manufacturer |
Hitachi S-3400N Link |
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| Staff Contact |
 Daniel Lewisdlewis17@umd.edu 301-405-5018 |
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| Rates | Large Commercial $133/hr Small Commercial / MTECH $63/hr External Non-profit / University $42/hr UMD $27/hr Staff Technical Assistance Time is added based on the time spent by staff members providing technical support, guidance & training outside of equipment training, and technical services for users of the lab. Click here for full rate details.
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| Reservations | No upcoming reservations at this time. Please login to make a reservation. |
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| External Materials |
If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring. |
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| Logs |
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| Manuals
You must have reservation permissions to view the manuals. Please login to view manuals. |
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| Recipes |
