| Description |
The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer. It operates between 190-1000nm wavelengths. The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:- Thickness (d) - Index of Refraction (n) - Extinction Coefficient (k) - Energy Bandgap (Eg) |
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| Location | FabLab | Main Fab Hall | |||||||||||||||
| Manufacturer |
N & K |
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| Staff Contact |
 John Abrahamsjabrah@umd.edu 301-405-5018 |
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| Rates | UMD $10/hr External Non-profit / University $12/hr Small Commercial / MTECH $15/hr Large Commercial $25/hr No Charge $0/hr |
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| Reservations | No upcoming reservations at this time. Please login to make a reservation. |
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| External Materials |
If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring. |
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| Logs |
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| SOPs |
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| Manuals
You must have reservation permissions to view the manuals. Please login to view manuals. |
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| Recipes |
