September 21, 2023 UMD Home NanoCenter AIMLab
Back to Equipment List N&K Spectrophotometer
Description The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer. It operates between 190-1000nm wavelengths. The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:
- Thickness (d)
- Index of Refraction (n)
- Extinction Coefficient (k)
- Energy Bandgap (Eg)
Location FabLab | Main Fab Hall
Manufacturer N & K
Staff Contact JohnJohn Abrahams
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
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External Materials

If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring.

Fri, Sep 01, 2023
11:00 am - 11:30 am
Samarth Sriram
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with Nam
Mon, Jun 12, 2023
2:30 pm - 3:30 pm
Nam Kim
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Deleted by: Nam Kim

Orientation Steven Douglass
Fri, Aug 16, 2019
9:30 am - 10:00 am
Mitchell Gross
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Tue, Jun 26, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
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Mon, Jun 25, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
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Deleted by: Lovlesh Kaushik

Records to show:
index.php (38 B)
met-03_sop_NK_Spectrophotometer_Rev_9_08 .pdf (126.93 KB)

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