Description |
The Auto ELIII Ellipsometer is used to measure the optical constants of bare surfaces as well as refractive indices, full-cycle thicknesses, and zero- through ninth-order thicknesses of thin single- or double-layer transparent films on opaque materials. The optical constants are automatically computed and displayed from the raw measurement data. |
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Location | FabLab | Main Fab Hall | |||||||||||||||
Manufacturer |
Rudolph Auto EL III |
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Staff Contact |
John Abrahams jabrah@umd.edu 301-405-5018 |
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Rates | ||||||||||||||||
Reservations | No upcoming reservations at this time. Please login to make a reservation. |
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External Materials |
If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring. |
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Logs |
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SOPs |
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Manuals
You must have reservation permissions to view the manuals. Please login to view manuals. |
CE_M2K_ESM-300.pdf (12.65 MB)
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Recipes |