April 18, 2025 UMD Home NanoCenter AIMLab
Back to Equipment List JEOL NEOARM AC-TEM
Description

* Not available for scheduling. Currently undergoing operating procedures writing process. More updates in the coming weeks. *

The Jeol NEOARM 200 Aberration Corrected TEM/STEM system includes a field emission gun, energy dispersive X-ray (EDS) and electron energy loss (EELS) spectrometers, 4D STEM camera, IDES Relativity, Synchrony and Luminary systems and several fast and high-resolution cameras for acquisition of images and data.

Highlights

  • High Brightness Cold FEG
  • 30-200kV
  • HR Pole Piece for maximum flexibility between analytical and resolution optimization
  • IDES Technology integration
  • Dual, large-area SDDs for efficient EDS collection
  • Highly stable probe current
  • COSMO Automated Corrector alignments

Specifics

NEOARM

  • Column and Corrector alignments provided at 30 kV, 80 kV, 200 kV
  • Resolution of .23nm in TEM
  • +/- 35/30 degrees of tilt in X/Y

STEM Cs-Corrector

  • CEOS ASCOR – Second-generation, higher-order corrector
  • Enables high-resolution imaging with large convergence angles and high probe currents
  • JEOL COSMO automated Corrector alignment routine

IDES Technologies

EDM + Synchrony

  • Electrostatic shutter enables ultrafast beam blanking and dose modulation
  • On-the-fly dose control while maintaining atomic resolution imaging
  • Programmable (pixel-by-pixel), user-defined dose management

Relativity

  • Electrostatic sub-framing to enable high-speed (kHz) frame rates
  • Integrated with TVIPS XF416 for in situ analysis
  • Data output in (common) hdf5 format

Luminary Micro

  • Compact Specimen Photoexcitation System
  • Laser introduced onto specimen with small spot size (< 40 µm FWHM)
  • Localized in situ observation of sintering, growth, melting, and other heating or optical phenomena

In-Situ Specimen Holders & Data Integration

Axon Core & Synchronicity Pro

  • Full Session metadata collection
  • Automated Specimen Drift Correction

Axon Dose

  • Faraday Cup and Precision Electrometer
  • Automated Beam Current Measurement
  • Automated Recording of Dose Profiles During Imaging

Fusion Select

  • MEMS chip specimen holder
  • Joule heating chips for fast specimen heating experiments
  • Electrical chips for biasing measurements

Poseidon Select

  • MEMS Liquid Cell holder
  • Integrated Gamry electronics for electrochemistry measurements

Atmosphere 210

  • MEMS Gas Cell holder
  • RGA Mass Spectrometer with integrated vacuum and mass-flow controller
Location AIM Lab | EAF B0103C
Manufacturer JEOL JEM-ARM200F
Link
Staff Contact JohnJohn Cumings
cumings@umd.edu
301-405-0789
Rates
No Charge
$0/hr
Large Commercial
$0/hr
Small Commercial / MTECH
$0/hr
External Non-profit / University
$0/hr
UMD
$0/hr
Reservations
Date Start End User
04/19/2025 12:00 AM 12:00 AM Wen-An Chiou
04/20/2025 12:00 AM 12:00 AM Wen-An Chiou

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External Materials

If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring.

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Building power outage.
Sat, Apr 19, 2025
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Wen-An Chiou
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Deleted by: Wen-An Chiou

Building power outage.
Sat, Apr 19, 2025
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Building power outage.
Fri, Apr 18, 2025
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