June 16, 2021 UMD Home FabLab AIMLab


Scanning Electron Microscopy (SEM), Focus Ion Beam (FIB) and Transmission Electron Microscopy (TEM) short courses that will be held in this winter break (January 14 through 25, 2013) at the NISP Lab, NanoCenter.

These short courses provide an introduction to SEM, FIB, and TEM, both theory and hands-on practice, for anyone with little or no prior experience.  Attendees will gain basic knowledge of how to operate a SEM, FIB, and/or TEM after taking the short course.  This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the SEM, FIB, and/or TEM.  Please see attached files for details. 

Deadline for registration is January 10, 2013.

Please let Dr. Wen-An Chiou (wachiou@umd.edu) know should you have any questions.

FIB Announcement (.doc)

SEM Announcement (.doc)

TEM Announcement (.doc)



January 4, 2013


«Previous Story  

 

 

Current Headlines

Postdoc Candidate Sought at Naval Research Laboratory

Eric Wachsman Elected President of Electrochemical Society

UMD, UMBC, ARL Announce Cooperative Agreement to Accelerate AI, Autonomy in Complex Environments

Liangbing Hu Named 2021/2022 Distinguished Scholar-Teacher

'Fluorinated interphase' bolsters water-based zinc battery chemistry

Engineering at Maryland magazine celebrates 40 Years of the Center for Minorities in Science and Engineering

Engineering Undergrads Recognized for Excellence

Eric Marksz Awarded Charles A. Caramello Distinguished Thesis Award

Building Energy Innovation in Maryland

A Paradigm Shift in Nanochannel Research

 

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

Communicate Join Email List
Contact Us
Follow us on TwitterTwitter logo

Links Privacy Policy
Sitemap
RSS

Copyright The University of Maryland University of Maryland
2004-2021