March 24, 2023 UMD Home FabLab AIMLab
N&K Spectrophotometer Back to Equipment List
Operational Status ‚óŹ Online
Description The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer. It operates between 190-1000nm wavelengths. The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:

- Thickness, d - index of refraction, n
- Extinction Coefficient, k
- Energy Bandgap, Eg
- Interface Roughness,
Location FabLab | Main Fab Hall
Manufacturer N & K
Staff Contact JohnJohn Abrahams
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Fri, Aug 16, 2019
9:30 am - 10:00 am
Mitchell Gross
View Reservation
Tue, Jun 26, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
View Reservation
Mon, Jun 25, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
View Reservation

Deleted by: Lovlesh Kaushik

Wed, Jun 06, 2018
2:30 pm - 4:00 pm
Nina Uchida
View Reservation
Etch and measure SiO2/Si wafers
Mon, Apr 16, 2018
10:30 am - 12:30 pm
Lovlesh Kaushik
View Reservation
Thickness measurement on Al subtrates
Records to show:
index.php (38 B)
met-03_sop_NK_Spectrophotometer_Rev_9_08 .pdf (126.93 KB)

You must have lab permissions to view the manuals.

Please login to view manuals or contact the lab staff to obtain permissions.


Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

Communicate Join Email List
Contact Us
Follow us on TwitterTwitter logo

Links Privacy Policy

Copyright The University of Maryland University of Maryland