March 28, 2024 UMD Home FabLab AIMLab
N&K Spectrophotometer Back to Equipment List
Operational Status ● Online
Description The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer. It operates between 190-1000nm wavelengths. The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:
- Thickness (d)
- Index of Refraction (n)
- Extinction Coefficient (k)
- Energy Bandgap (Eg)
Location FabLab | Main Fab Hall
Manufacturer N & K
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-5018
Rates
UMD
$10/hr
External Non-profit / University
$12/hr
Small Commercial / MTECH
$15/hr
Large Commercial
$25/hr
No Charge
$0/hr
Reservations No upcoming reservations at this time.
Logs
Fri, Sep 01, 2023
11:00 am - 11:30 am
Samarth Sriram
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with Nam
Mon, Jun 12, 2023
2:30 pm - 3:30 pm
Nam Kim
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Deleted by: Nam Kim

Orientation Steven Douglass
Fri, Aug 16, 2019
9:30 am - 10:00 am
Mitchell Gross
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Friday
Tue, Jun 26, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
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Mon, Jun 25, 2018
10:30 am - 12:00 pm
Lovlesh Kaushik
View Reservation

Deleted by: Lovlesh Kaushik

Records to show:
SOPs
index.php (38 B)
met-03_sop_NK_Spectrophotometer_Rev_9_08 .pdf (126.93 KB)
Manuals

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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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