| Operational Status | ● Online | |||||||||||||||
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| Description |
The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer. It operates between 190-1000nm wavelengths. The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:- Thickness (d) - Index of Refraction (n) - Extinction Coefficient (k) - Energy Bandgap (Eg) |
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| Location | FabLab | Main Fab Hall | |||||||||||||||
| Manufacturer |
N & K |
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| Staff Contact |
 John Abrahamsjabrah@umd.edu 301-405-5018 |
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| Rates | UMD $10/hr External Non-profit / University $12/hr Small Commercial / MTECH $15/hr Large Commercial $25/hr No Charge $0/hr |
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| Reservations | No upcoming reservations at this time. | |||||||||||||||
| Logs |
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| SOPs |
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| Manuals | You must have lab permissions to view the manuals. Please login to view manuals or contact the lab staff to obtain permissions. |
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| Recipes |
