September 23, 2017 UMD Home FabLab AIMLab
Back to Equipment List AFM -DI Nanoscope III multimode (Chemistry)
Description Digital Instruments (Veeco)Multimode AFM with nanoscope III controller10 micron scanner Nanoscope Version 5.3 software Capabilities Contact mode Tapping Mode Lateral Force Liquid cell Accesory AFM probes/supplies available in facility at cost price SiN contact probe (<15 nm tip radius) 4 cantilevers / Au-Cr coated Si Contact probe (< 10 nm tip radius) 1 cantilever / Au coated Si tapping probe (< 10 nm tip radius) 1 cantilever / Au coated 15 mm Specimen discs 12 mm glass sample mount 9.9 mm mica discs (interleafed) Gel-pak box for storing probes
Location SAC | Chemistry BO127
Staff Contact Karen Gaskell
Discussion Link Metrology Discussion Page
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External Non-profit / University
Small Commercial / MTECH
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Thu, Sep 21, 2017
3:00 pm - 6:30 pm
Doug Henderson
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Mon, Sep 18, 2017
1:30 pm - 2:15 pm
H M Iftekhar Jaim
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Fri, Sep 15, 2017
2:45 pm - 3:45 pm
Aaron Auerbach
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Fri, Sep 15, 2017
11:30 am - 12:30 pm
Aaron Auerbach
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Wed, Sep 13, 2017
10:00 am - 11:00 am
Shahriar Aghaeimeibodi
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