|Operational Status||● Online|
Ellipsometer is in horizontal mode. Check with John Abrahams for Vertical mode.
Software was upgraded 2-15-2019. If there are problems, please let me know as soon as possible.
$37/hour for UMD
$50/hour for Gov't- non-profit
$91/hr - small commercial
$160/hour for Large commercial.
Contact: John Abrahams at firstname.lastname@example.org or (301) 405-6664
The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85
|Location||FabLab | 2300 KIM (Bldg #225)|
J.A. Woollam M-2000D
External Non-profit / University
Small Commercial / MTECH
|Reservations||No upcoming reservations at this time.|
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