April 15, 2025 UMD Home FabLab AIMLab
JEOL NEOARM AC-TEM Back to Equipment List
Operational Status ● Online
Description

* Not available for scheduling. Currently undergoing operating procedures writing process. More updates in the coming weeks. *

The Jeol NEOARM 200 Aberration Corrected TEM/STEM system includes a field emission gun, energy dispersive X-ray (EDS) and electron energy loss (EELS) spectrometers, 4D STEM camera, IDES Relativity, Synchrony and Luminary systems and several fast and high-resolution cameras for acquisition of images and data.

Highlights

  • High Brightness Cold FEG
  • 30-200kV
  • HR Pole Piece for maximum flexibility between analytical and resolution optimization
  • IDES Technology integration
  • Dual, large-area SDDs for efficient EDS collection
  • Highly stable probe current
  • COSMO Automated Corrector alignments

Specifics

NEOARM

  • Column and Corrector alignments provided at 30 kV, 80 kV, 200 kV
  • Resolution of .23nm in TEM
  • +/- 35/30 degrees of tilt in X/Y

STEM Cs-Corrector

  • CEOS ASCOR – Second-generation, higher-order corrector
  • Enables high-resolution imaging with large convergence angles and high probe currents
  • JEOL COSMO automated Corrector alignment routine

IDES Technologies

EDM + Synchrony

  • Electrostatic shutter enables ultrafast beam blanking and dose modulation
  • On-the-fly dose control while maintaining atomic resolution imaging
  • Programmable (pixel-by-pixel), user-defined dose management

Relativity

  • Electrostatic sub-framing to enable high-speed (kHz) frame rates
  • Integrated with TVIPS XF416 for in situ analysis
  • Data output in (common) hdf5 format

Luminary Micro

  • Compact Specimen Photoexcitation System
  • Laser introduced onto specimen with small spot size (< 40 µm FWHM)
  • Localized in situ observation of sintering, growth, melting, and other heating or optical phenomena

In-Situ Specimen Holders & Data Integration

Axon Core & Synchronicity Pro

  • Full Session metadata collection
  • Automated Specimen Drift Correction

Axon Dose

  • Faraday Cup and Precision Electrometer
  • Automated Beam Current Measurement
  • Automated Recording of Dose Profiles During Imaging

Fusion Select

  • MEMS chip specimen holder
  • Joule heating chips for fast specimen heating experiments
  • Electrical chips for biasing measurements

Poseidon Select

  • MEMS Liquid Cell holder
  • Integrated Gamry electronics for electrochemistry measurements

Atmosphere 210

  • MEMS Gas Cell holder
  • RGA Mass Spectrometer with integrated vacuum and mass-flow controller
Location AIM Lab | EAF B0103C
Manufacturer JEOL JEM-ARM200F
Link
Staff Contact JohnJohn Cumings
cumings@umd.edu
301-405-0789
Rates
No Charge
$0/hr
Large Commercial
$0/hr
Small Commercial / MTECH
$0/hr
External Non-profit / University
$0/hr
UMD
$0/hr
Reservations
Date Start End User
04/16/2025 09:00 AM 03:00 PM Alex Hall
Logs
Wed, Apr 16, 2025
9:00 am - 3:00 pm
Alex Hall
View Reservation
EDS/EELS Mapping - Troubleshooting
Tue, Apr 15, 2025
12:00 pm - 4:00 pm
Alex Hall
View Reservation
STEM-EELS Mapping
Tue, Apr 15, 2025
9:00 am - 12:00 pm
Alex Hall
View Reservation
CEOS Support Session
Thu, Apr 10, 2025
1:00 pm - 5:00 pm
Alex Hall
View Reservation
STEM-EELS
Wed, Apr 09, 2025
1:00 pm - 5:00 pm
Alex Hall
View Reservation
STEM-EELS
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SOPs
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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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