June 6, 2020 UMD Home FabLab AIMLab



Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and FIB (Focused Ion Beam) short courses that will be offered this winter (January 14 to 17, 2018 for SEM, January 22 to 25 for TEM and January 28 to 31 for FIB) at the AIM Lab, NanoCenter.  

These short courses provide an introduction to SEM, TEM and FIB, both theory and hands-on practice, for anyone with little or no prior experience.  Attendees will gain basic knowledge of how to operate a SEM and/or TEM and/or FIB after taking the short course.  This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the SEM and/or TEM and/or FIB. 

The deadline for registration is January 10, 17 and 23, 2018  for SEM, TEM and FIB short courses, respectively.


To register, contact Dr. Wen-An Chiou, Director of the AIM Lab, Maryland NanoCenter. 
(301)-405-0541 
wachiou@umd.edu



January 3, 2019


«Previous Story  

 

 

Current Headlines

Pines: Stand in Solidarity, Unite Against Injustice

Promoting Diversity and Addressing Unconscious Bias

MSE Alum Awarded NSF Graduate Research Fellowship

UMD Researchers Design ‘Open’ Lithium-ion Battery

UMD Research Lab Receives ARO Grant to Investigate Reconfigurable Nanoparticle Assemblies

Two Engineers Among 2020-2021 Distinguished Scholar-Teachers

2020 Undergraduate Honors and Awards

Cleaning Natural Methane for Better Access to Renewable Energy

New, superfast method for ceramic manufacturing could open door to AI-driven materials discovery

Advance made towards next-generation rechargable batteries

 

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

Communicate Contact Us
Contact the Webmaster
Google+
Follow us on TwitterTwitter logo

Links Privacy Policy
Sitemap
RSS

Copyright The University of Maryland University of Maryland
2004-2020