The Micromanipulator probe station can accommodate up to 6" diameter samples. It has eight adjustable needle probes for testing devices and circuits on wafers. The Agilent 4155C Semiconductor Parameter Analyzer is menu-driven. Test routines for evaluation of transistors and electronic test structures are written and stored in the 4155C. Users are able to write and save their own programs.
Various multimeters are also available for device testing as well as an HP 576 Curve Tracer.
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