June 30, 2025 UMD Home FabLab AIM Lab
Hitachi S-3400 Variable Pressure SEM Back to Equipment List
Operational Status ● Online
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS silicon drift detector for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Rates
Large Commercial
$133/hr
Small Commercial / MTECH
$63/hr
External Non-profit / University
$42/hr
UMD
$27/hr
No Charge
$0/hr
Reservations No upcoming reservations at this time.
Logs
Mon, Jun 30, 2025
5:15 pm - 6:15 pm
Jay Easter
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Mon, Jun 30, 2025
10:30 am - 11:00 am
Jonathan Hummel
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EDS calibration
Mon, Jun 30, 2025
9:45 am - 10:00 am
Richard Hoft
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Fri, Jun 27, 2025
10:30 am - 12:30 pm
Christopher Tang
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Fri, Jun 27, 2025
10:00 am - 10:15 am
Richard Hoft
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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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