| Operational Status | ● In maintenance | ||||||||||||||||||||||||
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| Description |
The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS silicon drift detector for determining elemental composition of samples. Please, no powder samples in this SEM |
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| Location | FabLab |
Exploratory Lab
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| Manufacturer |
Hitachi S-3400N Link |
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| Staff Contact |
 Daniel Lewisdlewis17@umd.edu 301-405-5018 |
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| Rates | Large Commercial $133/hr Small Commercial / MTECH $63/hr External Non-profit / University $42/hr UMD $27/hr No Charge $0/hr |
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| Reservations |
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| Logs |
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| SOPs | |||||||||||||||||||||||||
| Manuals | You must have lab permissions to view the manuals. Please login to view manuals or contact the lab staff to obtain permissions. |
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| Recipes |
