September 25, 2022 UMD Home FabLab AIMLab
Hitachi S-3400 Variable Pressure SEM Back to Equipment List
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The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Fri, Sep 23, 2022
12:30 pm - 2:00 pm
Amanda Siciliano
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Thu, Sep 22, 2022
1:00 pm - 2:00 pm
Jonathan O'Neill
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Thu, Sep 22, 2022
12:00 pm - 1:00 pm
Richard Hoft
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Thu, Sep 22, 2022
10:30 am - 11:15 am
Christopher Tang
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Thu, Sep 22, 2022
9:15 am - 9:45 am
Brendan Jordan
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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