September 23, 2017 UMD Home FabLab AIMLab
Back to Equipment List Profilometer P-1 Long Scan Profiler
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
mlecates@umd.edu
301-405-5197
Discussion Link Metrology Discussion Page
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Rates
UMD
$71/hr
External Non-profit / University
$108/hr
Small Commercial / MTECH
$236.25/hr
Large Commercial
$300/hr
Reservations No upcoming reservations at this time.
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Logs
Thu, Mar 03, 2016
11:15 am - 11:45 am
Daniel Bae
View Reservation

Deleted by: Mark Lecates

Flatness measurement long scans
Thu, Dec 19, 2013
10:31 am -
Mark Lecates
4454Ã…
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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