March 23, 2023 UMD Home FabLab AIMLab
Profilometer P-1 Long Scan Profiler Back to Equipment List
Operational Status ● Online
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Wed, Nov 23, 2022
10:00 am - 11:00 am
Beihan Zhao
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Fri, Sep 16, 2022
9:00 am - 11:00 am
Mark Lecates
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Thu, Sep 15, 2022
8:30 pm - 9:30 pm
Beihan Zhao
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Tue, Sep 13, 2022
9:00 am - 11:30 am
Mark Lecates
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Mon, Sep 12, 2022
12:30 pm - 3:00 pm
Mark Lecates
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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