July 21, 2018 UMD Home FabLab AIMLab
Back to Equipment List Tescan XEIA Plasma FIB/SEM
Description

The world's first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2.5 μA thus increasing sputtering rate more than 50 times compared to conventional Ga source FIB. This predetermines XEIA for milling big volumes of materials that were time consuming or impossible in the past.

The XEIA is a fully PC controlled SEM with Schottky field emission cathode in combination with Xe Plasma Focused Ion Beam (SEM-FIB) column and also fully equipped with Gas Injection System (GIS) for five different gases. With more than 20 ports in the newly designed large sample chamber, the XEIA also integrates a variety of nano-analytical capabilities in one single instrument. The XEIA equipped with:

  • EDS (Energy Dispersive X-Ray Spectrometry)
  • CL (Cathodoluminescence)
For External nonprofit/university users: 1st 10 hours in a billing cycle will be billed at $137/hour; any additional hours in that same billing cycle will be billed at $110/hour
Location AIM Lab | 1237E Kim Eng. Bldg.
Manufacturer
Staff Contact Wen-AnWen-An Chiou
wachiou@umd.edu
301-405-0541
Rates
UMD
$45/hr
External Non-profit / University
$137/hr
Small Commercial / MTECH
$190/hr
Large Commercial
$235/hr
Reservations
Date Start End User
07/24/2018 01:00 PM 03:00 PM Kevin Boergens
Logs
Tue, Jul 24, 2018
1:00 pm - 3:00 pm
Kevin Boergens
View Reservation
Assisted by JCR.
Fri, Jul 20, 2018
3:00 pm - 4:30 pm
Shengjie Xie
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Deleted by: Jiancun Rao

Thu, Jul 12, 2018
1:00 pm - 3:00 pm
Jisoo Shin
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Deleted by: Jiancun Rao

Wed, Jul 11, 2018
3:00 pm - 3:30 pm
Christopher Klingshirn
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Wed, Jul 11, 2018
2:30 pm - 3:00 pm
Gang Li
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Deleted by: Jiancun Rao

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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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