|Operational Status||● Online|
|Description||The microtome is used for preparing samples for transmission electron microscopy (TEM) and atomic force microscopy (AFM). In general, TEM samples must be less than 100 nm thick and AFM requires a flat, smooth surface. It uses a knife of diamond or glass to make cuts of 100 nm or less. Samples are embedded in epoxy to hold them and are cut using knives of diamond or glass.|
|Location||FML | 1213 Jeong H. Kim Engineering|
Leica EM UC6
External Non-profit / University
Small Commercial / MTECH
|Reservations||No upcoming reservations at this time.|
You must have lab permissions to view the manuals.
Please login to view manuals or contact the lab staff to obtain permissions.