Event Information |
Introduction to Focused Ion Beam for the new FIB operator, Day 3 of 4 Focused Ion Beam (FIB) is an extremely useful and powerful tool in physical/materials science, engineering, biological and medical sciences research. The AIM Lab at NanoCenter will be offering a short course in FIB during this summer break (June 2018) using our new Tescan dual beam FIB system. The short course provides an introduction to the FIB for those with little or no prior experience. This course covers basic principles and knowledge of operating the FIB. In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.
To enroll, please print and fill out the application form, and submit to the AIM Lab office by 12:00 pm, June 20, 2018 (Wednesday) at room 1234 Kim Building. Students accepted into the class will be informed by e-mail by Friday (06/22/18). For more information regarding the FIB short course, please contact Wen-An Chiou at AIM Lab, or (301)-405-0541 or send an e-mail to wachiou@umd.edu This Event is For: Clark School • Graduate • Undergraduate • Faculty • Staff • Post-Docs |