Tom Isabel
JEOLManaging (High) Tension: Atomic Resolution (S)TEM from 30 kV to 300 kV
&
Electron Microscopy Workshops, with in-depth presentations by experienced microscopists.
Click here for more information about the EM Workshops
Feature plenary talks by prominent scientists in nanoscience, a poster session for breaking research (with awards), and networking opportunities.
We have updated the poster delivery and poster layout sections of the posters page.
The AIM Lab will have an Open House during both the EM Workshop and NanoDay.
We have updated information on the talks for the EM Workshop.
We have updated information on the talks for the EM Workshop.
Submitting a poster? NanoDay's poster session will feature seven categories. Posters will be judged for originality, quality and newsworthiness. Register for NanoDay here and submit your abstract here.
Registration is now open for NanoDay 2016. There is no fee to register.
NanoDay 2016 is official! Please save the dates, May 17 for EM Workshops, and May 18 for Maryland NanoCenter NanoDay.
Three Dimensional Structural and Chemical Imaging: A discussion of panoscopic methods
Managing (High) Tension: Atomic Resolution (S)TEM from 30 kV to 300 kV
The Dedicated STEM: Deceptively Simple Usage with Cutting Edge Results
Surface and Transmission Imaging at High Resolution for True Characterization of Nano-technology Materials at 30kV and Below
Fundamentals of Quantitative Analysis with EDS, Combined with X-Ray Map Imaging
Extreme EDS Count Rates from Beam-Sensitive and Nano-Scale Features
ZEISS ORION NanoFab: Applications and New Developments
Orthogonal 3D Analysis FIB-SEM and Its Latest Applications
Advances in EBSD: Transmission Kikuchi Diffraction, Dynamical Simulation, and 3D Data Analysis
New Applications of Fast EBSD Detectors
Application of High Speed Cameras for 4D Data Collection in STEM
A Revolutionary Era of 120kV Transmission Electron Microscopy: All Digital Design, High-mag. Tomography and Ionic Liquid
ASEM - Tabletop Atmospheric Scanning Electron Microscope
Innovative Tool for Post FIB Sample Preparation: Fischiones M1080 PicoMill
Contactless Sample Preparation Methods & Applications using the Hitachi IM4000 Broad Ion Beam Milling System
Advancing Energy Storage through Materials: The need for multiscale investigation from the molecular to the mesoscale
Imaging the mesoscale behavior of materials for energy harvesting and storage
