November 18, 2019 UMD Home FabLab AIMLab

These shortcourses are separate events from NanoDay and require registering in advance. To sign up, please download and fill out each respective course you plan to attend and email the completed form to NISP Lab director, Wen-An Chiou (wachiou@umd.edu).

SEM Shortcourse - June 17th - 20th, 2014
An Introduction to SEM and EDS for the New SEM Operator

The workshop provides an introduction to the SEM for those with little or no prior experience. This course covers basic principles and knowledge of the scanning electron microscope including energy-dispersive x-ray spectroscopy (EDS). In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.

$350 per person, $300 per person from the same research group and/or participate FIB/TEM short course.

$175 per person for taking lectures only.

Fees for non-UMD participants will be different. Please check with the NISP Lab office.

Download SEM Registration Application

TEM Shortcourse - June 24th - 27th, 2014
An Introduction to TEM for the New TEM Operator

This is a hands-on course aimed at introducing the basic concepts, instrumentations and application of TEM to new operators. The lecture portion of the course will focus on fundamental theory in TEM; laboratory exercises are designed to provide instruction on both the operation of TEM and useful techniques for materials characterization using TEM. This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the TEM.

$400 per person*, $350 per person for members of research groups with multiple enrollments, or for individuals concurrently enrolled in the SEM short course.

Lecture only: $200 per person.

* This fee applies to UMD users only. Different fees apply for non-UMD participants; please check with the NISP Lab office.

Download TEM Registration Application

FIB Shortcourse - June 30th - July 3rd, 2014
An Introduction to FIB for the New FIB Operator

Focus Ion Beam is an extremely useful and powerful tool in physical/materials science and engineering research. The short course provides an introduction to the FIB technology for those with little or no prior experience. This course covers basic principles, instrumentation, and applications. In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.

$375 per person, $325 per person from the same research group.

Fees for non-UMD participants will be different. Please check with the NISP Lab office.

Download FIB Registration Application

Sponsors

Bruker Edax Tescan Hitachi FEI Company JEOL Angstrom Scientific

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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